Structural and optical characterization of Ba.sub.0.8./sub.Sr.sub.0.2./sub.TiO.sub.3./sub. PLD deposited films

0308037 - FZÚ 2008 RIV NL eng J - Journal Article
Aulika, I. - Pokorný, Jan - Zauls, V. - Kundzins, K. - Rutkis, M. - Petzelt, Jan
Structural and optical characterization of Ba_0.8Sr_0.2TiO₃ PLD deposited films.
[Strukturní a optické charakterizace vrstevBa_0.8Sr_0.2TiO₃ nanesených laserovou ablací.]
Optical Materials. Roč. 30, č. 7 (2008), s. 1017-1022. ISSN 0925-3467. E-ISSN 1873-1252
Institutional research plan: CEZ:AV0Z10100520
Keywords : Raman scattering * structure * internal stress * optical properties * ferroelectrics * thin films
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.714, year: 2008

Structural and optical properties of Ba_0.8Sr_0.2TiO₃ ferroelectric thin films on Si and Si/SiO₂/Ti/SrRuO₃ substrates were studied using XRD, Raman, AFM and optical refractometry.

Strukturní a optické vlastnosti vrstev Ba_0.8Sr_0.2TiO₃ na podložkách Si a Si/SiO₂/Ti/SrRuO₃ byly studovány pomocí XRD, Ramanovy spektroskopie, AFM a optické refraktometrie.
Permanent Link: http://hdl.handle.net/11104/0160633