0303624 - URE-Y 20000067 RIV US eng J - Journal Article
Czajka, R. - Horák, Jaromír - Lošťák, P. - Karamazov, S. - Vaniš, Jan - Walachová, Jarmila
Characterization and nanometer-scale modifications of Bi₂Te₃ surface via atomic force mircoscopy.
Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. Roč. 18, May/June (2000), s. 1194-1197. ISSN 0734-2101. E-ISSN 1520-8559
R&D Projects: GA ČR GA102/97/0427
Institutional research plan: CEZ:AV0Z2067918
Keywords : nanostructured materials * semiconductor materials * thermoelectric devices
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Impact factor: 1.569, year: 2000

The Bi₂Te₃ crystal was studied by means of the atomic force miroscopy (AFM). The atomic resolution, existence of Te vacancies and existence of steps were observed on cleaved surface of Bi₂Te₃ (Te plane). The formation of nanostructures on Bi₂Te₃ is schown.
Permanent Link: http://hdl.handle.net/11104/0113812