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The use of an optically trapped microprobe for scanning details of surface
- 1.0205715 - UPT-D 20030098 RIV PL eng C - Conference Paper (international conference)
Šerý, Mojmír - Jákl, Petr - Ježek, Jan - Jonáš, Alexandr - Zemánek, Pavel - Liška, M.
The use of an optically trapped microprobe for scanning details of surface.
Proceedings of the 13th Polish-Czech-Slovak Optical Conference on Wave and Quantum Aspects of Contemporary Optics (Proc. SPIE 5259). Washington: SPIEThe International Society for Optical Engineering, 2003, s. 166 - 169.
[SPIE: Wave and Quantum Aspects of Contemporary Optics. Krzyzowa (PL), 09.09.2002-13.09.2002]
R&D Projects: GA ČR GA101/00/0974
Institutional research plan: CEZ:AV0Z2065902
Keywords : optical tweezers * two-photon fluorescence * surface profiling
Subject RIV: BH - Optics, Masers, Lasers
We present two methods for surface profiles measurement using optically trapped probe in tightly focused laser beam (optical tweezers). The first method is based on a continuous contact of the probe with the surface (contact mode) and the second one employes the alternating contact (tapping mode). The probe deviations are detected by two-photon fluorescence excited by the trapping beam and emitted by the trapped dyed probe.
Permanent Link: http://hdl.handle.net/11104/0101328
Number of the records: 1