Performance of detector elements for electron microscopes

0205232 - UPT-D 20000008 RIV CZ eng J - Journal Article
Schauer, Petr - Autrata, Rudolf
Performance of detector elements for electron microscopes.
Jemná mechanika a optika. Roč. 45, č. 10 (2000), s. 268-270. ISSN 0447-6441
R&D Projects: GA ČR GA102/98/0796
Institutional research plan: CEZ:AV0Z2065902
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering

Signal processing in scanning and transmission electron microscopes is analysed in this paper. Distinguished are criteria of principal and commercial significance, and problematic parameters of different systems are highlighted. The most important properties of scintillation detection systems and imaging screens are discussed more in detail. For the scintillation detector, the analysis of conversion of the signal to photons, their transport from emission centres to PMT photocathode, and their conversion to photoelectrons is carried out. For the imaging screen, the attention is focused on the spectral matching and spatial resolution.
Permanent Link: http://hdl.handle.net/11104/0100850