Number of the records: 1
Measurements of very low energy secondary and backscattered electron coefficients
- 1.0205090 - UPT-D 980068 RIV US eng J - Journal Article
Zadražil, Martin - El Gomati, M. M. - Walker, A.
Measurements of very low energy secondary and backscattered electron coefficients.
Journal of Computer Assisted Microscopy. Roč. 9, č. 2 (1997), s. 123-124. ISSN 1040-7286.
[MCEM '97 /3./ - Multinational Congress on Electron Microscopy. Portorož, 05.10.1997-08.10.1997]
Grant - others:CEC(XE) CP93/12283
Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
Permanent Link: http://hdl.handle.net/11104/0100710
Number of the records: 1