0185019 - UJF-V 20000188 RIV RU eng J - Journal Article
Ono, M. - Mikula, Pavol - Harjo, S. - Šaroun, Jan - Yoneda, K. - Sawano, J. - Sakurai, Y. - Kobayashi, T.
Focusing Bent perfect-crystal neutron monochromator a key to high - resolution stress/strain measurement studies of polycrystalline materials.
Materials Science Forum. 321/324, - (2000), s. 296-301. ISSN 0255-5476.
[European Powder Diffraction Conference EPDIC /6./. Budapest, 22.08.1998-25.08.1998]
R&D Projects: GA ČR GV202/97/K038; GA AV ČR KSK1010601
Subject RIV: BG - Nuclear, Atomic and Molecular Physics, Colliders
Impact factor: 0.597, year: 2000

A new neutron focusing device with bent Si-single crystal has been installed at high-resolution neutron diffractometerdedicated to strain/stress investigations in polycrystalline materials and introduced into routine operation as a neutron strain scanner using reactor neutrons from supermirror guider at Kyoto University Research Reactor (KUR). Properties of the diffractometer are described on the basis of experimental results when one slab or two slabs of curved Si single crystals are employed as monochromator : i.e. 1) the luminosity 2) the absolute value of monochromatic neutrons with the Au-foil activation method, 3) beam profiles with the imaging plate method, 4) characteriyation of the diffractometer with .alpha. Fe (211) peak and its comparison with the Bragg optical prediction. It is confirmed that the FWHM of the instrumental ëd/d-profile of the peak can be less than 3 x 10.sub.-3 at d = 1.17 A and the resolution permits us to investigate both the macro- and microstrains with goodluminosity. The luminosity becomes about ten times comparingwith the one by the conventional pyrolitic graphite monochromator (PG).
Permanent Link: http://hdl.handle.net/11104/0081443