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Angle Resolved X-ray Photoelectron Spectroscopy Study of Pd/NbOx/Nb Interfaces
- 1.0181353 - UFCH-W 20020008 RIV NL eng J - Journal Article
Thiam, Michel Malick - Bastl, Zdeněk
Angle Resolved X-ray Photoelectron Spectroscopy Study of Pd/NbOx/Nb Interfaces.
Surface Science. 507-510, - (2002), s. 678-682. ISSN 0039-6028. E-ISSN 1879-2758
R&D Projects: GA ČR GA202/99/1714; GA ČR GV202/98/K002
Institutional research plan: CEZ:AV0Z4040901
Keywords : photoelectron spectroscopy * palladium * metallic films
Subject RIV: CF - Physical ; Theoretical Chemistry
Impact factor: 2.140, year: 2002
The thermal stability of ultrathin palladium overlayers deposited at room temperature onto oxidized niobium has been studied by high resolution angle-resolved X-ray photoelectron spectroscopy. Inward diffusion of Pd followed by formation of intermetallic phase at NbOx/Nb interface was found to occur at temperatures above 600 K. This finding explains the observation of a large decrease of adsorption capacity of Pd/NbOx/Nb samples towards carbon monoxide caused by their annealing.
Permanent Link: http://hdl.handle.net/11104/0077935
Number of the records: 1