Number of the records: 1
Residual Stress Determination by Whole Pattern Analysis-Application to Synchrotron HEXRD Measurements on Thermal Sprayed Coatings
- 1.0178915 - UFP-V 20010031 GB eng C - Conference Paper (international conference)
Gnaeupel-Herold, T. - Haeffner, D. R. - Prask, H. J. - Matějíček, Jiří
Residual Stress Determination by Whole Pattern Analysis-Application to Synchrotron HEXRD Measurements on Thermal Sprayed Coatings.
Proceedings of the 6th International Conference on Residual Stresses. London: IOM Communications Ltd., 2000, s. 751-758.
[International Conference on Residual Stresses/6th./. Oxford (GB), 10.07.2000-12.07.2000]
Institutional research plan: CEZ:AV0Z2043910
Keywords : thermal sprayed
Subject RIV: JK - Corrosion ; Surface Treatment of Materials
Permanent Link: http://hdl.handle.net/11104/0075757
Number of the records: 1