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Time-Resolved Reflectivity Studies of Phase Transition in Polycrystalline Si Induced by Excimer Laser Irradiation
- 1.0174191 - MU-W 950154 RIV IT eng C - Conference Paper (international conference)
Přikryl, Petr - Černík, M. - El-Kader, K. M. A. - Ulrych, Ivo - Černý, R. - Chvoj, Zdeněk - Cháb, Vladimír
Time-Resolved Reflectivity Studies of Phase Transition in Polycrystalline Si Induced by Excimer Laser Irradiation.
Proceedings of Polycrystalline Semiconductors 1995. 1995 - (Pizzini, S.), s. 41
[Pollycrystalline Semiconductors 1995. Gargnano (IT), 09.09.1995-14.09.1995]
R&D Projects: GA ČR 203/93/2383
Permanent Link: http://hdl.handle.net/11104/0071205
Number of the records: 1