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Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon
- 1.0134659 - FZU-D 20030560 RIV US eng J - Journal Article
Jiříček, Petr - Zemek, Josef - Lejček, Pavel - Lesiak, B. - Jablonski, A. - Čerňanský, Marian
Stability of the inelastic mean free paths determined by elastic peak electron spectroscopy in nickel and silicon.
Journal of Vacuum Science & Technology A : Vacuum, Surfaces and Films. Roč. 20, č. 2 (2002), s. 447-455. ISSN 0734-2101. E-ISSN 1520-8559
R&D Projects: GA ČR GA202/02/0237
Institutional research plan: CEZ:AV0Z1010914
Keywords : Monte Carlo simulation * electron-solid interaction * inelastic mean free path(IMFP) * elastic peak electron spectroscopy(EPES)
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.301, year: 2002
The scatter between the measured IMFPs obtained in the present work and predictive formulas IMFP values is determined.
Permanent Link: http://hdl.handle.net/11104/0032553
Number of the records: 1