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Measurements of escape probability of photoelectrons and the inelastic mean free path in silver sulphide
- 1.0134643 - FZU-D 20030543 RIV GB eng J - Journal Article
Zemek, Josef - Jiříček, Petr - Hucek, Stanislav - Lesiak, B. - Jablonski, A.
Measurements of escape probability of photoelectrons and the inelastic mean free path in silver sulphide.
Surface and Interface Analysis. Roč. 30, - (2000), s. 222-227. ISSN 0142-2421. E-ISSN 1096-9918
Grant - others:GAUK(CZ) 1051-10/733
Institutional research plan: CEZ:AV0Z1010914
Keywords : escape probability * IMFP * Ag2S
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.215, year: 2000
The escape probability as a function of depth of origin for the S 2s photoelectrons exhibits non-monotonic beahviour, with a maximum at a depth of 0.6-0.8 nm.
Permanent Link: http://hdl.handle.net/11104/0032538
Number of the records: 1