0134314 - FZU-D 20030210 RIV AT eng J - Journal Article
Starý, V. - Jurek, Karel
X-ray emission from thin films on a substrate - Calculation and experiments.
Microchimica Acta. Roč. 139, - (2002), s. 179-184. ISSN 0026-3672. E-ISSN 1436-5073
Institutional research plan: CEZ:AV0Z1010914; CEZ:MSM 210000021
Keywords : Monte Carlo simulation * electron microanalysis * X-ray emission * thin films
Subject RIV: BM - Solid Matter Physics ; Magnetism
Impact factor: 1.050, year: 2001

In Monte Carlo code the single crystal scattering model is employed for simulation of X-ray emission from thin films of Au on the Si substrate. The electron beam energy was in the range 10-30keV. These data were compared with experimental values of k-ratios calculated from X-ray intensities of Au M and Au L characteristic lines.
Permanent Link: http://hdl.handle.net/11104/0032222