0133992 - FZU-D 20020280 RIV US eng J - Článek v odborném periodiku
Láska, Leoš - Krása, Josef - Stöckli, M. P. - Fehrenbach, C. W.
Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics.
Review of Scientific Instruments. Roč. 73, č. 2 (2002), s. 776-778. ISSN 0034-6748. E-ISSN 1089-7623
Grant CEP: GA AV ČR IAA1010819; GA AV ČR IAA1010105; GA MŠMT LN00A100
Výzkumný záměr: CEZ:AV0Z1010921
Klíčová slova: ion-induced secondary electron emission * laser ion source beam diagnostics
Kód oboru RIV: BH - Optika, masery a lasery
Impakt faktor: 1.437, rok: 2002

The number of secondary electrons, emitted when multiply charged ions impact on metallic probe surface was measured to make the quantitative ion diagnostics based on this process more precise.
Trvalý link: http://hdl.handle.net/11104/0031938