0133992 - FZU-D 20020280 RIV US eng J - Journal Article
Láska, Leoš - Krása, Josef - Stöckli, M. P. - Fehrenbach, C. W.
Multiply charged ion-induced secondary electron emission from metals relevent for laser source beam diagnostics.
Review of Scientific Instruments. Roč. 73, č. 2 (2002), s. 776-778. ISSN 0034-6748. E-ISSN 1089-7623
R&D Projects: GA AV ČR IAA1010819; GA AV ČR IAA1010105; GA MŠMT LN00A100
Institutional research plan: CEZ:AV0Z1010921
Keywords : ion-induced secondary electron emission * laser ion source beam diagnostics
Subject RIV: BH - Optics, Masers, Lasers
Impact factor: 1.437, year: 2002
Permanent Link: http://hdl.handle.net/11104/0031938