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Microstructure-dependent magnetoresistance in La.sub.1-x./sub.MnO.sub.3./sub. thin films

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    0132901 - FZU-D 20000157 RIV NL eng J - Journal Article
    Fröhlich, K. - Vávra, I. - Gömöry, F. - Šouc, J. - Bydžovský, J. - Kováč, P. - Dobrovodský, J. - Maryško, Miroslav
    Microstructure-dependent magnetoresistance in La1-xMnO3 thin films.
    Journal of Magnetism and Magnetic Materials. Roč. 211, - (2000), s. 67-72. ISSN 0304-8853. E-ISSN 1873-4766
    Grant - others:VEGA(XX) 2/6057/99; VEGA(XX) 1/4284/97; INCO Copernicus(XE) IC15-CT96-0735
    Institutional research plan: CEZ:AV0Z1010914
    Subject RIV: BM - Solid Matter Physics ; Magnetism
    Impact factor: 0.996, year: 2000

    Thin La1-xMnO3 films were grown by metal organic chemical vapour deposition at temperature Td=700C on various types of substrates. The magnetoresistance in this films in correlation with their microstructure is studied by transmission electron microscopy.
    Permanent Link: http://hdl.handle.net/11104/0030896


     
     

Number of the records: 1  

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