0132048 - FZU-D 980258 RIV US eng J - Journal Article
Vorlíček, Vladimír - Železný, Vladimír - Tiwari, A. N. - Krejci, M. - Zogg, H.
Determination of the crystallographic orientation of CuInSe2 thin films by Raman and infrared spectroscopy.
Journal of Applied Physics. Roč. 82, - (1997), s. 5484-5487. ISSN 0021-8979. E-ISSN 1089-7550
Impact factor: 1.630, year: 1997

Permanent Link: http://hdl.handle.net/11104/0030088