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Review/Citation:  ZEIPL, R., JELÍNEK, M., VANIŠ, Jan, REMSA, J., KOCOUREK, T., NAVRÁTIL, J. Scanning thermal microscopy of Bi2Te3 and Yb0.19Co4Sb12 thermoelectric films. Applied Physics A - Materials Science & Processing. 2016, 122(4), 478. ISSN 0947-8396. E-ISSN 1432-0630
Requested document:  UFE 0469519.pdf - Other
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