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Review/Citation:  ASSALAUOVA, D., KIM, Y. Y., BOBKOV, S., KHUBBUTDINOV, R., ROSE, M., ALVAREZ, R., ANDREASSON, Jakob, BALAUR, E., CONTRERAS, A., DEMIRCI, H., GELISIO, L., HAJDU, Janos, HUNTER, M. S., KURTA, R. P., LI, H., MCFADDEN, M., NAZARI, R., SCHWANDER, P., TESLYUK, A., WALTER, P., XAVIER, P. L., YOON, Ch. H., ZAARE, S., ILYIN, V. A., KIRIAN, R.A., HOGUE, B. G., AQUILA, A., VARTANYANTS, I.A. An advanced workflow for single-particle imaging with the limited data at an X-ray free-electron laser. IUCrJ. 2020, 7(6), 1102-1113. ISSN 2052-2525. E-ISSN 2052-2525
Requested document:  0543387.pdf - Publisher’s postprint
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