Review/Citation: MARCHAND, R., ŠACHL, Radek, KALBÁČ, Martin, HOF, Martin, TROMP, R., AMARO, Mariana, VAN DER MOLEN, M., JUFFMANN, T. Optical Near-Field Electron Microscopy. emPhysical Review Applied. /em 2021, 16(1), 014008. ISSN 2331-7019. E-ISSN 2331-7019
Requested document: 0544249.pdf - Publisher’s postprint
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