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Review/Citation:  DROPKA, N., HOLEŇA, Martin, FRANK-ROTSCH, C. TMF Otimization in VGF Crystal Growth of GaAs by Artificial Neural Networks and Gaussian Process Models. In: BAAKE, E., NACKE, B., eds. Electrotechnologies for Material Processing. Hannover: Vulkan, 2017, s. 203-208. ISBN 978-3-80273-095-5.
Requested document:  a0477799.pdf - Publisher’s postprint
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