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Review/Citation:  LORINČÍK, Jan, VESELÁ, D., VYTYKÁČOVÁ, S., ŠVECOVÁ, B., NEKVINDOVÁ, P., MACKOVÁ, Anna, MIKŠOVÁ, Romana, MALINSKÝ, Petr, BOETTGER, R. Comparison of SIMS and RBS for depth profiling of silica glasses implanted with metal ions. Journal of Vacuum Science & Technology B. 2016, 34(3), 03H129. ISSN 1071-1023
Requested document:  UFE 0464368.pdf - Other
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