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0494940 - ÚTAM 2019 RIV US eng J - Journal Article
Kumpová, Ivana - Vopálenský, Michal - Fíla, Tomáš - Kytýř, Daniel - Vavřík, Daniel - Pichotka, Martin - Jakůbek, Jan - Keršner, Z. - Klon, J. - Seitl, S. - Sobek, J.
On-the-fly fast X-ray tomography using a CdTe pixelated detector – application in mechanical testing.
IEEE Transactions on Nuclear Science. Roč. 65, č. 12 (2018), s. 2870-2876. ISSN 0018-9499. E-ISSN 1558-1578
R&D Projects: GA MŠMT(CZ) EF16_019/0000766
Institutional support: RVO:68378297
Keywords : cadmium telluride (CdTe) detectors * fracture mechanics * material characterization * mechanical testing
OECD category: Electrical and electronic engineering
Impact factor: 1.428, year: 2018
https://ieeexplore.ieee.org/document/8482343
Permanent Link: http://hdl.handle.net/11104/0288021