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0583091 - ÚFP 2024 RIV US eng J - Journal Article
Psota, Pavel - Kredba, J. - Stašík, M. - Nečásek, Jakub - Matoušek, O. - Lédl, Vít
Absolute wavelength scanning interferometry for measuring the thickness of optical elements.
Optics Express. Roč. 31, č. 3 (2023), s. 3565-3578. ISSN 1094-4087
R&D Projects: GA MŠMT(CZ) EF16_026/0008390
Institutional support: RVO:61389021
Keywords : interferometry * wavelength * optical elements
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.8, year: 2022
Method of publishing: Open access
https://opg.optica.org/oe/fulltext.cfm?uri=oe-31-3-3565&id=525241
Permanent Link: https://hdl.handle.net/11104/0351090