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0582247 - ÚFP 2024 RIV US eng J - Journal Article
Tkachenko, V. - Lipp, V. - Buescher, M. - Capotondi, F. - Hoeppner, H. - Medvedev, Nikita - Pedersoli, E. - Prandolini, M.J. - Rossi, G.M. - Tavella, F. - Toleikis, S. - Windeler, M. - Ziaja, B. - Teubner, U.
Effect of Auger recombination on transient optical properties in XUV and soft X-ray irradiated silicon nitride.
Scientific Reports. Roč. 11, č. 1 (2021), č. článku 5203. ISSN 2045-2322. E-ISSN 2045-2322
R&D Projects: GA MŠMT LTT17015; GA MŠMT EF16_013/0001552
Institutional support: RVO:61389021
Keywords : XUV * X-ray * silicon nitride
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 4.997, year: 2021
Method of publishing: Limited access
https://www.nature.com/articles/s41598-021-84677-w
Permanent Link: https://hdl.handle.net/11104/0350345