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0575442 - ÚPT 2024 GB eng A - Abstract
Hotz, M. T. - Martis, J. - Radlička, Tomáš - Bacon, N. J. - Dellby, N. - Lovejoy, T. C. - Quillin, S. C. - Hwang, H. Y. - Singh, P. - Křivánek, O. L.
Atomic Resolution SE Imaging in a 30-200 keV Aberration-corrected UHV STEM.
Microscopy and Microanalysis. Cambridge University Press. Roč. 29, S1 (2023), s. 2064-2065. ISSN 1431-9276. E-ISSN 1435-8115.
[Microscopy & Microanalysis 2023. 23.07.2023-27.07.2023, Minneapolis]
Institutional support: RVO:68081731
https://academic.oup.com/mam/article/29/Supplement_1/2064/7228064
Permanent Link: https://hdl.handle.net/11104/0345233