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  1. 1.
    0569549 US BXXS
    Scheuer, J. (ed.) - Shahriar, S. M. (ed.)
    Optical and Quantum Sensing and Precision Metrology II.
    Bellingham: SPIE, 2022. Proceedings of SPIE, 12016. ISBN 978-1-5106-4903-3. ISSN 0277-786X
     
     

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