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0568882 - FZÚ 2023 RIV CH eng J - Journal Article
Gutiérrez, Y. - Espinoza Herrera, Shirly J. - Zahradník, Martin - Khakurel, Krishna - Resl, J. - Cobet, C. - Hingerl, K. - Duwe, M. - Thiesen, P. - Losurdo, M.
Characterizing optical phase-change materials with spectroscopic ellipsometry and polarimetry.
Thin Solid Films. Roč. 763, DEC (2022), č. článku 139580. ISSN 0040-6090. E-ISSN 1879-2731
R&D Projects: GA MŠMT EF16_019/0000789; GA MŠMT EF15_003/0000447; GA MŠMT(CZ) LM2018141
Grant - others:OP VVV - ADONIS(XE) CZ.02.1.01/0.0/0.0/16_019/0000789; OP VVV - ELIBIO(XE) CZ.02.1.01/0.0/0.0/15_003/0000447
Institutional support: RVO:68378271
Keywords : ellipsometry * polarimetry * phase -change materials
OECD category: Particles and field physics
Impact factor: 2.1, year: 2022
Method of publishing: Open access
Permanent Link: https://hdl.handle.net/11104/0340160