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0556001 - FZÚ 2023 RIV NL eng J - Journal Article
Domonkos, M. - Jackivová, Rajisa - Pathó, A.
Image analysis algorithm for the verification of hexagonal symmetry in spherical nanostructures.
Microelectronic Engineering. Roč. 251, Jan (2022), č. článku 111635. ISSN 0167-9317. E-ISSN 1873-5568
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:68378271
Keywords : image analysis * nanosphere lithography * defect detection * hexagonal ordering * scanning electron microscopy * Python
OECD category: Electrical and electronic engineering
Impact factor: 2.3, year: 2022
Method of publishing: Limited access
https://doi.org/10.1016/j.mee.2021.111635
Permanent Link: http://hdl.handle.net/11104/0330401