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0552955 - FZÚ 2022 RIV eng P - Patent Document
Nejdl, Jaroslav
Apparatus for spectrum and intensity profile characterization of a beam, use thereof and method thereof.
2021. Owner: Fyzikální ústav AV ČR, v. v. i. Date of the patent acceptance: 09.02.2021. Patent Number: US10914628B2
R&D Projects: GA MŠMT EF16_019/0000789; GA MŠMT(CZ) LM2018141
Grant - others:OP VVV - ADONIS(XE) CZ.02.1.01/0.0/0.0/16_019/0000789
Institutional support: RVO:68378271
Keywords : spectrometry * beam intensity profile diagnostics * XUV * X-rays
OECD category: Fluids and plasma physics (including surface physics)
https://worldwide.espacenet.com/patent/search/family/060327011/publication/US10914628B2?q=US10914628B2
Permanent Link: http://hdl.handle.net/11104/0328013