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0551125 - ÚPT 2023 RIV CH eng J - Journal Article
Konvalina, Ivo - Paták, Aleš - Zouhar, Martin - Müllerová, Ilona - Fořt, Tomáš - Unčovský, M. - Materna Mikmeková, Eliška
Quantification of stem images in high resolution sem for segmented and pixelated detectors.
Nanomaterials. Roč. 12, č. 1 (2022), č. článku 71. E-ISSN 2079-4991
R&D Projects: GA TA ČR(CZ) TN01000008
Grant - others:AV ČR(CZ) StrategieAV21/6
Program: StrategieAV
Institutional support: RVO:68081731
Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
OECD category: Electrical and electronic engineering
Impact factor: 5.3, year: 2022
Method of publishing: Open access
https://www.mdpi.com/2079-4991/12/1/71
Permanent Link: http://hdl.handle.net/11104/0326569