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  1. 1.
    0551125 - ÚPT 2023 RIV CH eng J - Journal Article
    Konvalina, Ivo - Paták, Aleš - Zouhar, Martin - Müllerová, Ilona - Fořt, Tomáš - Unčovský, M. - Materna-Mikmeková, Eliška
    Quantification of stem images in high resolution sem for segmented and pixelated detectors.
    Nanomaterials. Roč. 12, č. 1 (2022), č. článku 71. E-ISSN 2079-4991
    R&D Projects: GA TA ČR(CZ) TN01000008
    Grant - others: AV ČR(CZ) StrategieAV21/6
    Program: StrategieAV
    Institutional support: RVO:68081731
    Keywords : STEM segmented detector * pixelated detector * scanning electron microscopy * Monte Carlo simulations * ray tracing * quantitative imaging
    OECD category: Electrical and electronic engineering
    Impact factor: 5.076, year: 2020
    Method of publishing: Open access
    https://www.mdpi.com/2079-4991/12/1/71
    Permanent Link: http://hdl.handle.net/11104/0326569