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0547875 - FZÚ 2022 RIV US eng J - Journal Article
Kovaleva, N. N. - Chvostová, Dagmar - Pacherová, Oliva - Muratov, A.V. - Fekete, Ladislav - Sherstnev, I.A. - Kugel, K.I. - Pudonin, F.A. - Dejneka, Alexandr
Bismuth layer properties in the ultrathin Bi–FeNi multilayer films probed by spectroscopic ellipsometry.
Applied Physics Letters. Roč. 119, Nov (2021), č. článku 183101. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA ČR(CZ) GA20-21864S; GA MŠMT(CZ) EF16_019/0000760
Grant - others:OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
Institutional support: RVO:68378271
Keywords : Bismuth * layer, properties * ultrathin Bi–FeNi * multilayer films * spectroscopic ellipsometry
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 3.971, year: 2021
Method of publishing: Limited access
https://doi.org/10.1063/5.0069691
Permanent Link: http://hdl.handle.net/11104/0324047