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0546598 - FZÚ 2022 RIV CH eng J - Journal Article
Izsák, Tibor - Vanko, G. - Babčenko, Oleg - Vincze, A. - Vojs, M. - Zaťko, B. - Kromka, Alexander
Influence of SiON interlayer on the diamond/GaN heterostructures studied by Raman and SIMS measurements.
Materials Science and Engineering B-Advanced Functional Solid-State Materials. Roč. 273, Nov. (2021), č. článku 115434. ISSN 0921-5107. E-ISSN 1873-4944
R&D Projects: GA MŠMT LM2018110; GA MŠMT(CZ) 8X20035; GA MŠMT(CZ) EF16_019/0000760
Grant - others:OP VVV - SOLID21(XE) CZ.02.1.01/0.0/0.0/16_019/0000760
Institutional support: RVO:68378271
Keywords : polycrystalline diamond * GaN * Raman spectroscopy * stress * SIMS
OECD category: Coating and films
Impact factor: 3.407, year: 2021
Method of publishing: Limited access
https://doi.org/10.1016/j.mseb.2021.115434
Permanent Link: http://hdl.handle.net/11104/0323195