Basket

  1. 1.
    0544249 - ÚFCH JH 2022 RIV US eng J - Journal Article
    Marchand, R. - Šachl, Radek - Kalbáč, Martin - Hof, Martin - Tromp, R. - Amaro, Mariana - van der Molen, M. - Juffmann, T.
    Optical Near-Field Electron Microscopy.
    Physical Review Applied. Roč. 16, č. 1 (2021), č. článku 014008. ISSN 2331-7019. E-ISSN 2331-7019
    R&D Projects: GA ČR(CZ) GX19-26854X
    Institutional support: RVO:61388955
    Keywords : Electron microscopy * Image resolution * Optical imaging technique * Membrane
    OECD category: Physical chemistry
    Impact factor: 4.931, year: 2021
    Method of publishing: Limited access
    Permanent Link: http://hdl.handle.net/11104/0321279
    FileDownloadSizeCommentaryVersionAccess
    0544249.pdf21.4 MBPublisher’s postprintrequire
     
     

  This site uses cookies to make them easier to browse. Learn more about how we use cookies.