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0543290 - ÚFE 2022 RIV GB eng J - Journal Article
He, Y. - Lin, S. - Robert, Marc Louis Hadrien - Li, H. - Zhang, P. - Piliarik, Marek - Chen, XW.
Multiscale modeling and analysis for high-fidelity interferometric scattering microscopy.
Journal of Physics D-Applied Physics. Roč. 54, č. 27 (2021), č. článku 274002. ISSN 0022-3727. E-ISSN 1361-6463
Institutional support: RVO:67985882
Keywords : interferometric scattering microscopy * multiscale modeling * near-to-far-field transformation * label-free * single-particle tracking * mass photometry
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.409, year: 2021
Method of publishing: Limited access
https://doi.org/10.1088/1361-6463/abf70d
Permanent Link: http://hdl.handle.net/11104/0320523