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0541788 - ÚJF 2022 RIV CH eng J - Journal Article
Hlushko, K. - Macková, Anna - Zálešák, J. - Burghammer, M. - Davydok, A. - Krywka, C. - Daniel, R. - Keckes, J. - Todt, J.
Ion irradiation-induced localized stress relaxation in W thin film revealed by cross-sectional X-ray nanodiffraction.
Thin Solid Films. Roč. 722, MAR (2021), č. článku 138571. ISSN 0040-6090. E-ISSN 1879-2731
Research Infrastructure: CzechNanoLab - 90110
Institutional support: RVO:61389005
Keywords : Tungsten thin film * Ion irradiation * residual stress
OECD category: Nano-materials (production and properties)
Impact factor: 2.358, year: 2021
Method of publishing: Limited access
https://doi.org/10.1016/j.tsf.2021.138571
Permanent Link: http://hdl.handle.net/11104/0319321