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    0541681 - ÚFCH JH 2022 RIV NL eng J - Journal Article
    Gutiérrez-Fernández, E. - Rodriguez, Álvaro - García-Gutiérrez, M. C. - Nogales, A. - Rebollar, E. - Solano, E. - Ezquerra, T. A.
    Photoinduced Resist-free Imprinting (PRI) in fullerene thin films as revealed by Grazing Incidence Small-angle X-ray scattering.
    Applied Surface Science. Roč. 548, MAY 2021 (2021), č. článku 149254. ISSN 0169-4332. E-ISSN 1873-5584
    Institutional support: RVO:61388955
    Keywords : Photoinduced Resist-free Imprinting (PRI) * Grazing Incidence Small-angle X-ray Scattering (GISAXS) * Laser Induced Periodic Surface Structures (LIPSS) * Fullerene (PCBM)
    OECD category: Physical chemistry
    Impact factor: 7.392, year: 2021
    Method of publishing: Limited access
    Permanent Link: http://hdl.handle.net/11104/0319212
    FileDownloadSizeCommentaryVersionAccess
    0541681.pdf26.6 MBPublisher’s postprintrequire
     
     

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