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0541300 - ÚFCH JH 2022 RIV US eng J - Journal Article
Hummel, S. - Elibol, K. - Zhang, D. - Sampathkumar, Krishna - Frank, Otakar - Eder, D. - Schwalb, C. - Kotakoski, J. - Meyer, J.C. - Bayer, B. C.
Direct visualization of local deformations in suspended few-layer graphene membranes by coupled in situ atomic force and scanning electron microscopy.
Applied Physics Letters. Roč. 118, č. 10 (2021), č. článku 103104. ISSN 0003-6951. E-ISSN 1077-3118
R&D Projects: GA MŠMT(CZ) 8J18AT005
Institutional support: RVO:61388955
Keywords : Scanning electron microscopy * Graphene * Atomic force microscopy
OECD category: Physical chemistry
Impact factor: 3.971, year: 2021
Method of publishing: Open access
Permanent Link: http://hdl.handle.net/11104/0318881