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0539534 - FZÚ 2021 RIV GB eng J - Journal Article
Balbi, G. - Barbero, M. - Beccherle, R. - Bindi, M. - Breugnon, P. - Butti, P. - Cinca, D. - Dickinson, J. - Ferrere, D. - Fougeron, D. - Garcia-Sciveres, M. - Pascual, J.G. - Gaudiello, A. - Gemme, C. - Giangiacomi, N. - Hemperek, T. - Jeanty, L. - Kepka, Oldřich - Kocian, M. - Lantzsch, K. - Liu, P. - Martin, C. - Mekkaoui, A. - Menouni, M. - Potamianos, K. - Rozanov, A. - Takubo, Y. - Wensing, M.
Measurements of single event upset in ATLAS IBL.
Journal of Instrumentation. Roč. 15, č. 6 (2020), s. 1-30, č. článku P06023. ISSN 1748-0221. E-ISSN 1748-0221
R&D Projects: GA MŠMT(CZ) LTT17018
Research Infrastructure: CERN-CZ II - 90104
Institutional support: RVO:68378271
Keywords : semiconductor detector: pixel * noise * ATLAS * electronics: readout
OECD category: Particles and field physics
Impact factor: 1.415, year: 2020
Method of publishing: Open access
Permanent Link: http://hdl.handle.net/11104/0317254