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0538507 - FZÚ 2021 RIV US eng J - Journal Article
Espinoza Herrera, Shirly J. - Samparisi, F. - Frassetto, F. - Richter, Steffen - Rebarz, Mateusz - Finke, Ondřej - Albrecht, Martin - Jurkovič, Matěj - Hort, Ondřej - Fabris, N. - Zymaková, Anna - Mai, Dong-Du - Antipenkov, Roman - Nejdl, Jaroslav - Poletto, L. - Andreasson, Jakob
Characterization of the high harmonics source for the VUV ellipsometer at ELI Beamlines.
Journal of Vacuum Science and Technology. Part B. Nanotechnology & Microelectronics. Roč. 38, č. 2 (2020), s. 1-5, č. článku 024005. ISSN 2166-2746. E-ISSN 2166-2754
R&D Projects: GA MŠMT EF16_019/0000789; GA MŠMT EF15_003/0000447; GA MŠMT LQ1606
Grant - others:OP VVV - ADONIS(XE) CZ.02.1.01/0.0/0.0/16_019/0000789; OP VVV - ELIBIO(XE) CZ.02.1.01/0.0/0.0/15_003/0000447
Research Infrastructure: ELI Beamlines III - 90141
Institutional support: RVO:68378271
Keywords : VUV ellipsometry * VUV polarizer * HHG * XUV ellipsometry
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 1.416, year: 2020
Method of publishing: Open access
Permanent Link: http://hdl.handle.net/11104/0316302