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0536979 - ÚPT 2021 CZ eng A - Abstract
Konvalina, Ivo - Daniel, Benjamin - Zouhar, Martin - Paták, Aleš - Piňos, Jakub - Radlička, Tomáš - Frank, Luděk - Müllerová, Ilona - Materna Mikmeková, Eliška
Study of electron scattering phenomena of advanced materials by UHV SLEEM/ToF.
Microscopy 2020. Praha: Československá mikroskopická společnost, 2020. s. 95-96.
[Microscopy 2020. 06.10.2020-07.10.2020, Lednice]
R&D Projects: GA TA ČR(CZ) TN01000008
Institutional support: RVO:68081731
Keywords : electron scattering phenomena
OECD category: Electrical and electronic engineering
Permanent Link: http://hdl.handle.net/11104/0314731