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  1. 1.
    0525112 - ÚPT 2021 RIV CH eng J - Journal Article
    Skoupý, Radim - Fořt, Tomáš - Krzyžánek, Vladislav
    Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration.
    Nanomaterials. Roč. 10, č. 2 (2020), č. článku 332. E-ISSN 2079-4991
    R&D Projects: GA ČR GA17-15451S; GA MPO(CZ) FV30271
    Institutional support: RVO:68081731
    Keywords : SEM * quantitative imaging * back-scattered electrons * standardless calibration * electron mirror * sample bias * Monte Carlo simulation * thin coating layers
    OECD category: Nano-materials (production and properties)
    Impact factor: 5.076, year: 2020
    Method of publishing: Open access
    https://www.mdpi.com/2079-4991/10/2/332
    Permanent Link: http://hdl.handle.net/11104/0309322
     
     

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