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  1. 1.
    0524885 - ÚPT 2021 RIV CZ eng C - Conference Paper (international conference)
    Skoupý, Radim - Krzyžánek, Vladislav
    Determination of thickness refinement using STEM detector segments.
    10th Anniversary International Conference on Nanomaterials - Research and Application (NANOCON 2018). Ostrava: Tanger, 2019, s. 677-681. ISBN 978-80-87294-89-5.
    [Anniversary International Conference on Nanomaterials - Research and Application (NANOCON) /10./. Brno (CZ), 17.10.2018-19.10.2018]
    R&D Projects: GA ČR GA17-15451S; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : electron-microscopy * Quantitative STEM * thickness determination * detector segments * Monte Carlo simulation
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0309122