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  1. 1.
    0522221 - ÚPT 2020 US eng A - Abstract
    Mikmeková, Šárka - Jánský, P. - Kolařík, V. - Müllerová, Ilona
    Surface imaging with UHV SLEEM and SEM LEEM.
    Microscopy and Microanalysis. Roč. 25, S2 (2019), s. 444-445. ISSN 1431-9276.
    [Microscopy & Microanalysis 2019 Meeting. 04.08.2019-08.08.2019, Portland]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : surface imaging * UHV SLEEM * SEM LEEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Materials engineering
    Permanent Link: http://hdl.handle.net/11104/0306716