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0506256 - ÚFM 2020 RIV US eng J - Journal Article
Lee, Lok Y. - Frentrup, M. - Vacek, Petr - Kappers, Menno J. - Wallis, David J. - Oliver, Rachel A.
Investigation of stacking faults in MOVPE-grown zincblende GaN by XRD and TEM.
Journal of Applied Physics. Roč. 125, č. 10 (2019), č. článku 105303. ISSN 0021-8979. E-ISSN 1089-7550
R&D Projects: GA MŠMT(CZ) EF16_027/0008056; GA MŠMT(CZ) LQ1601
Institutional support: RVO:68081723
Keywords : Epilayers * Gallium nitride * High resolution transmission electron microscopy * III-V semiconductors * Silicon carbide * Stacking faults * X ray diffraction * Zinc sulfide
OECD category: Electrical and electronic engineering
Impact factor: 2.286, year: 2019
Method of publishing: Open access
http://orca.cf.ac.uk/120129/1/Wallis%20D%20-%20Investigation%20of%20stacking%20faults%20in%20MOVPE-grown%20....pdf
Permanent Link: http://hdl.handle.net/11104/0300842