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  1. 1.
    0502126 - ÚPT 2019 NL eng A - Abstract
    Konvalina, Ivo - Paták, Aleš - Materna-Mikmeková, Eliška - Müllerová, Ilona
    STEM detector in SEM.
    FEELIS-III. Amsterdam: ARCNL, 2018. s. 55-56.
    [LEELIS-III. Low Energy Elwctrons: Lithography, Imaging and Soft Matter. 12.11.2018-13.11.2018, Amsterdam]
    R&D Projects: GA TA ČR(CZ) TE01020118; GA MŠk(CZ) LO1212; GA MŠk ED0017/01/01
    Institutional support: RVO:68081731
    Keywords : STEM * SEM
    Subject RIV: JA - Electronics ; Optoelectronics, Electrical Engineering
    OBOR OECD: Electrical and electronic engineering
    Permanent Link: http://hdl.handle.net/11104/0294115