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0499570 - FZÚ 2019 RIV NL eng J - Journal Article
Houdková, Jana - Branecky, M. - Plichta, T. - Jiříček, Petr - Zemek, Josef - Cech, V.
Chemical depth profile of layered a-CSiO:H nanocomposites.
Applied Surface Science. Roč. 456, Oct (2018), s. 941-950. ISSN 0169-4332. E-ISSN 1873-5584
R&D Projects: GA MŠMT EF16_013/0001406; GA MŠMT(CZ) LM2015088
Grant - others:OP VVV - SAFMAT(XE) CZ.02.1.01/0.0/0.0/16_013/0001406
Institutional support: RVO:68378271
Keywords : XPS depth pro filing * rgon gas cluster ion beam * layered nanocomposite * Young's modulus * plasma-enhanced chemical vapor deposition
OECD category: Condensed matter physics (including formerly solid state physics, supercond.)
Impact factor: 5.155, year: 2018
Permanent Link: http://hdl.handle.net/11104/0291762