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0496537 - FZÚ 2019 RIV CZ eng C - Conference Paper (international conference)
Stuchlík, Jiří - Fajgar, Radek - Kupčík, Jaroslav - Remeš, Zdeněk - Stuchlíková, The-Ha
Characterization of hydrogenated silicon thin films and diode structures with integrated germanium nanoparticles.
Nanocon 2017 : conference proceedings : 9th International Conference on Nanomaterials - Research & Application. Ostrava: Tanger Ltd., 2018, s. 123-127. ISBN 9788087294819.
[NANOCON 2017. International Conference on Nanomaterials - Research & Application /9./. Brno (CZ), 18.10.2017-20.10.2017]
R&D Projects: GA MŠMT(CZ) LTC17029
Grant - others:AV ČR(CZ) KONNECT-007
Program: Bilaterální spolupráce
Institutional support: RVO:68378271 ; RVO:67985858
Keywords : PECVD * a-Si:H diode structures * Ge * nanoparticles
OECD category: Condensed matter physics (including formerly solid state physics, supercond.); Physical chemistry (UCHP-M)
Permanent Link: http://hdl.handle.net/11104/0289330