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  1. 1.
    0494380 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
    Zouhar, Martin - Radlička, Tomáš - Oral, Martin - Konvalina, Ivo
    Inelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer.
    Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7.
    [Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
    R&D Projects: GA TA ČR(CZ) TE01020118
    Institutional support: RVO:68081731
    Keywords : electron microscopy * time of flight * inelastic mean free path * low energy
    OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
    Permanent Link: http://hdl.handle.net/11104/0287642