0494380 - ÚPT 2019 RIV CZ eng C - Conference Paper (international conference)
Zouhar, Martin - Radlička, Tomáš - Oral, Martin - Konvalina, IvoInelastic mean free path from raw data measured by low-energy electrons time-of-flight spectrometer.
Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Proceedings of the 16th International Seminar. Brno: Institute of Scientific Instruments The Czech Academy of Sciences, 2018, s. 86-87. ISBN 978-80-87441-23-7.
[Recent Trends in Charged Particle Optics and Surface Physics Instrumentation. Skalský dvůr (CZ), 04.06.2018-08.06.2018]
R&D Projects: GA TA ČR(CZ) TE01020118
Institutional support: RVO:68081731
Keywords : electron microscopy * time of flight * inelastic mean free path * low energy
OECD category: Atomic, molecular and chemical physics (physics of atoms and molecules including collision, interaction with radiation, magnetic resonances, Mössbauer effect)
Permanent Link: http://hdl.handle.net/11104/0287642
