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0492824 - FZÚ 2019 RIV US eng J - Journal Article
Milov, I. - Makhotkin, I.A. - Sobierajski, R. - Medvedev, Nikita - Lipp, V. - Chalupský, Jaromír - Sturm, J.M. - Tiedtke, K. - de Vries, G. - Störmer, M. - Siewert, F. - van de Kruijs, R. - Louis, E. - Jacyna, I. - Jurek, M. - Juha, Libor - Hájková, Věra - Vozda, Vojtěch - Burian, Tomáš - Saksl, K. - Faatz, B. - Keitel, B. - Ploenjes, E. - Schreiber, S. - Toleikis, S. - Loch, R. - Hermann, M. - Strobel, S. - Nienhuys, H.-K. - Gwalt, G. - Mey, T. - Enkisch, H. - Bijkerk, F.
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Optics Express. Roč. 26, č. 15 (2018), s. 19665-19685. ISSN 1094-4087
R&D Projects: GA ČR(CZ) GA17-05167s; GA MŠMT LG15013
Institutional support: RVO:68378271
Keywords : free-electron lasers * XUV mirrors * Ruthenium material * single-shot damage of thin films
OECD category: Optics (including laser optics and quantum optics)
Impact factor: 3.561, year: 2018
Permanent Link: http://hdl.handle.net/11104/0286255