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0489598 - ÚPT 2019 RIV NL eng J - Journal Article
Zelinka, Jiří - Oral, Martin - Radlička, Tomáš
Novel simulation method of space charge effects in electron optical systems including emission of electrons.
Ultramicroscopy. Roč. 184, JAN (2018), s. 66-76. ISSN 0304-3991. E-ISSN 1879-2723
R&D Projects: GA MŠMT(CZ) LO1212; GA MŠMT ED0017/01/01
Institutional support: RVO:68081731
Keywords : space charge * self-consistent simulation * aberration polynomial * electron emission
OECD category: Electrical and electronic engineering
Impact factor: 2.644, year: 2018
Permanent Link: http://hdl.handle.net/11104/0283982